Corrosion of Cu/Al Plane Contact Type Terminal Connector
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Abstract
Cu/Al plane contact type terminal connectors were produced by ultrasonic dip soldering technique. The phases and microstructure of the corrosion products, corrosion mechanism and effect of the corrosion process on the electrical property of the Cu/Al terminal connector were studied through a 7 days NaCl salt spray experiment. The results show that corrosion of the Cu/Al terminal connector mainly resulted from the galvanic corrosion between Al plate and Sn-Pb alloy solder. The corrosion products were complicated, mainly including oxides, hydroxides and alkaline chlorides of Al and Sn. Corrosion cracks of the connector located at the Al plate/the Sn-Pb alloy solder interface. The electrical resistivity of the connector increased obviously as the corrosion time increased.
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